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You and your team contend with increasing system complexity, multi-decade program lifecycles, and resource (time, budget, and expertise) scarcity. At NI, we take a platform-based approach to test by delivering flexible test architectures that...

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If you’re thinking of purchasing a specialized piece of an automated RF test system, such as a matrix switch, custom switch assembly, or switched-filter bank, this FAQ is for you. Learn about how to determine when you should consider a specialized...

Speed up development, verify best performance and start up series production with confidence.

The high input power requirement of a Device under Test (DUT) introduces challenges to the measurement, such as overheating and calibration. This application note describes the measurement setup for measuring the s-parameters of the high-power...

Creating Arbitrary Waveforms Doesn’t Have to be Difficult!

You're expected to deliver excellent results while staying within stringent budget constraints. Did you know that your test assets are critical to your success? Our new complimentary eBook offers eight ways to shift your perspective, enhance your...