Safran Federal Systems
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Tester Simulates Crowded GNSS Signal Environments

July 17, 2025
The rackmount BroadSim Genesis test system is equipped to test multiple-antenna situations with thousands of satcom signals, including jammers.

Our crowded skies are filled with satellite signals that must be tested. To serve that purpose, Safran Federal Systems launched its BroadSim Genesis at the Institute of Navigation’s Joint Navigation Conference (ION JNC 2025) in Cincinnati, Ohio.

Developed for Global Navigation Satellite System (GNSS) simulation and Naval Information Warfare Systems Command (NAVWAR) testing of satellites, BroadSim Genesis supports generation of as many as 2,000 signals, to duplicate signal environments often typical of low-Earth-orbit (LEO) and medium-Earth-orbit (MEO) satellite constellations.

BroadSim Genesis (see image above) is well-suited for testing multiple-antenna and multiple-aircraft settings, including with jamming signals and other signal threats to satcom operation. The flexible system features an intuitive front panel that has N-type connectors for field-ready use.

Trevor Dougherty, vice-president of sales at Safran Federal Systems, said, “BroadSim Genesis is built for operators who demand flexibility, fidelity, and performance in their GNSS simulation tools. Whether validating mission equipment, training for NAVWAR scenarios, or assessing new PNT architectures, BroadSim Genesis gives defense users the edge they need.”

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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