Safran DSI Acquires Imaging and Sensing
Safran Defense and Space Inc. (Safran DSI) added to its capabilities in advanced imaging and sensing technologies through the acquisition of Attollo Engineering.
Safran is well established in the design and development of shortwave infrared (SWIR) and mid-wave infrared (MWIR) imaging systems and laser-sensing technology. The company now expands into Attollo’s area of small sensor cores and laser imaging for aerospace and defense (A&D) and commercial customers.
Following the acquisition, Attollo will continue to operate as a merchant supplier of sensors and subsystems across defense and commercial markets.
Joe Bogosian, president and chief executive officer (CEO) of Safran DSI, acknowledged the excellent value that Attollo brings with the merger: “Attollo’s technology broadens Safran DSI’s reach across multiple platforms, enabling faster, more accurate execution no matter the mission. Attollo’s advanced infrared and laser sensing technologies and cameras will significantly expand our U.S. customers’ capabilities in intelligence, surveillance, and reconnaissance (ISR) missions.”
In response to Bogosian, Attollo Engineering’s CEO Michael MacDougal, noted, “We are excited to join Safran DSI and contribute our imaging technologies to deliver cost-effective, mission-critical solutions for the defense and aerospace sectors. This acquisition will allow us to expand service to our current customers and gain exposure to support new customers.”
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About the Author
Jack Browne
Technical Contributor
Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.