Focus Microwaves

Dollard-des-Ormeaux, Ontario H9B3H7


About Focus Microwaves

Together, the three companies under the Focus Microwaves Group umbrella cover a wide range of non-50 Ohm measurement products and systems, from active and passive load pull tuners and noise characterization systems to pulsed IV measurements and bias tees.


1603 St. Regis
Dollard-des-Ormeaux, Ontario H9B3H7
+1 514 684 4554

More Info on Focus Microwaves

The Focus Microwaves Group comprises Focus Microwaves Inc., Mesuro Ltd. and Auriga PIV Tech Inc. They are All Engineering and Manufacturing Corporations based in Montreal (Canada), Cardiff (UK) and Merrimack (USA) respectively, as well as a dedicated Sales and Support office in Beijing. Our team now counts over 60 employees worldwide.

Together, the three companies under the Focus Microwaves Group umbrella cover a wide range of non-50 Ohm measurement products and systems, from active and passive load pull tuners and noise characterization systems to pulsed IV measurements and bias tees. With our in-house engineering and manufacturing capabilities, we are able to develop our innovative products quickly and effectively, continuously bringing to market new solutions for the ever-changing demands of the RF landscape.

Read more about Focus Microwaves from the Founder & CEO, Dr. Christos Tsironis

Articles & News

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Test & Measurement

Testing Interest in 5G at 2019 IMS Exhibition

May 29, 2019
The industry’s move to higher frequencies is apparent from the growing number of test instruments on display at the 2019 IEEE IMS exhibition.
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Philadelphia Opens Its Doors to 2018 IMS

May 22, 2018
As the applications extrapolate for wireless devices and interest grows in millimeter-wave frequencies, the RF/microwave industry gathers together with great optimism for the ...
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Test & Measurement

The Top Products of 2017

Dec. 1, 2017
Covering everything from 5G communications to military applications, the industry delivered a number of impressive products in 2017.
Rohde & Schwarz
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RF/Microwave Industry Returns to Boston for EDICON

Oct. 13, 2017
The second-ever edition of this event to be held in the continental U.S. drew in a crowd to its show floor and technical sessions.
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2017 IEEE IMS Exhibitors Prepare for “The Wave”

May 17, 2017
Visitors to the RF/microwave industry’s largest conference and exhibition can sample some of the hardware, software, and test-equipment products that are turning 5G and IoT into...
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Passive Standards Aid Noise System Verification

Oct. 10, 2013
Passive noise standards can be used to calibrate an validate the performance of impedance-tuner-based noise measurement systems.

All content from Focus Microwaves

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Balanced UHF LNA Simplifies Cell Towers

Sept. 9, 2013
A balanced amplifier created for use in 900-MHz cell towers can contribute to simpler cellular system design.
Test & Measurement

Companies Join Forces to Provide Load Pull Solutions

July 2, 2013
To allow for more effective source and load pull testing of amplifiers and other microwave components, vendors are teaming to provide more solutions for a variety of applications...
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Sampling An Array Of Test Probes And Fixtures

Feb. 6, 2013
RF/microwave probes and test fixtures provide invaluable measurement paths between a device to be tested and the test signal/analysis equipment.
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Active components

Appraising Different Load-Pull Approaches

Sept. 13, 2012
Load-pull techniques are invaluable for understanding the behavior of an active device or component under changing impedance conditions. By understanding the differences among...
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Active components

Industry Shows Versatility At 2012 IMS

Aug. 10, 2012
Held in Canada for only the second time in its history, the 2012 IEEE International Microwave Symposium (IMS) brought a large influx of microwave engineers to Montreal, Quebec...
Test & Measurement

Tuners Help With Load-Pull/Noise Testing

June 14, 2012
Visitors to the 2012 Montreal IMS have an opportunity to visit one of the area's more interesting local companies, Focus Microwaves, at booth No. 1007. With its extensive lines...

Probes and Fixtures Ease Microwave Testing

Feb. 16, 2012
Although they are often viewed as accessories, RF/microwave wafer probes and test fixtures provide the means to characterize many devices that might otherwise be difficult to ...

Fixtures and Probes Aid RF Measurements

Oct. 14, 2010
Those seeking to connect small packages or circuit boards to coaxial test equipment will find the solution in the form of universal microwave test fixtures and low-loss microwave...
Test & Measurement

Load-Pull System Aids Nonlinear Device Modeling

Aug. 26, 2009
By combining harmonic load-pull measurements with X-parameter model extraction, it is possible to create transistor models that accurately represent device behavior under nonlinear...