Tuners Help With Load-Pull/Noise Testing

June 14, 2012
Visitors to the 2012 Montreal IMS have an opportunity to visit one of the area's more interesting local companies, Focus Microwaves, at booth No. 1007. With its extensive lines of load-pull and broadband noise measurement systems, the company is a key ...

Visitors to the 2012 Montreal IMS have an opportunity to visit one of the area's more interesting local companies, Focus Microwaves, at booth No. 1007. With its extensive lines of load-pull and broadband noise measurement systems, the company is a key supplier for those involved in analysis and development of active devices and amplifiers. As an example, the Focus model iCCMT-5020-TC Intelligent Computer Controlled Microwave Tuner supports both load-pull and noise measurements from 2 to 50 GHz. It is ideal for the characterization of packaged and on-wafer transistors, using the company's proprietary TCP/IP compatible iTuner technology with built-in microprocessor and command language. The design allows tuning to any interpolated impedance within system's tuning range, with accuracy of typically 40 dB or better. The iTuner-based system can be used with commercial software tools, including LabView™ from National Instruments and Agilent VEE™ from Agilent Technologies.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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