Tester Checks Reverse Recovery Of Diodes

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May 7, 2009

Model AVR-CD1-B is an instrument developed by Avtech Electrosystems to evaluate the reverse recovery time of diodes and other semiconductor devices. It can operate remotely under RS-232C and GPIB control and is cable of applying a forward bias pulse of +0.1 to +10.0 A to a device under test (DUT). At the end of the pulse, the current ramps downward at an adjustable rate of 100 to 200 A/microsecond until the diode stops conducting. The current waveforms generated by the instrument are suitable for MIL-STD-750E Method 4031.4 Test Condition D measurements, and custom versions are also available.

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.