Conductive RF Test Environments Boost Confidence in UE, SoC, and Chipset Designs (Download)
Verifying RF performance at every stage of the ecosystem requires a new test approach to keep pace with the market changes. A more repeatable methodology than over-the-air (OTA) is necessary to conduct measurements efficiently and accurately for the new wireless age. Such a test environment may also provide greater cost efficiencies than traditional radio channel emulators/simulators.