Probe Station Designed For Lifetime Of Testing

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Dec. 28, 2006

The model PS4L probe station from SemiProbe is designed for a lifetime of testing. The versatile microwave probe station can be upgraded over and over to meet growing needs and applications including on-wafer and printed-circuit-board (PCB) testing. Ideal for universities and research facilities, the PS4L can be used for microwave testing at frequencies from DC through 220 GHz, depending upon the probe attachments. For more information, don't miss the Special Report on SemiProbe scheduled for the February 2007 issue of Microwaves & RF magazine, or visit the company's website at http://www.semiprobe.com.

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.