Improve Those On-Wafer Test Skills

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June 13, 2007

On-wafer measurements of large-signal, power devices has never been easy. But a webcast offered by Cascade Microtech can make these measurements a bit simpler. Scheduled for Tuesday, June 26th, at 1 PM EST and 10 PM PDT, the webcast will cover high-current probing for DC and pulsed RF measurements, wafer-level safety, and thin-film chuck mounting among other issues. The webcast speaker is Cali Sartor, Senior Product Manager. For more information on the webcast, use the first link below:

Wafer Probing Webcast (https://event.on24.com/eventRegistration/EventLobbyServlet?target=registration.jsp&eventid= 45924&sessionid=1&key=3A256D28B485225C1CA1C1E9725FA2F0&sourcepage=register) Cascade Microtech (www.cmicro.com)

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.