Real-Time DSO Targets Compliance Test with 13-GHz Analog Bandwidth and 40-GS/s Rate

Aug. 13, 2025

With high-speed signal capture and analysis capabilities, Rigol’s DS80000 digital oscilloscopes quickly isolate faults and quantify data protocol compliance.

David Maliniak

Related To:

Microwaves & RF

Fault isolation, which leads to the subsequent validation of high-speed circuits, is a critical element of the engineer’s task. To further that mission, Rigol Technologies’ DS80000, an eighth-generation digital real-time oscilloscope, brings to the table a 13-GHz maximum analog bandwidth and a 40-GS/s sampling rate.

The instrument is suited for signal-integrity testing of high-speed digital circuits, RF front-end modules, optical communications components, and performance evaluation of high-speed SerDes, FPGAs, ASICs, and more.

In a recent demonstration, Rigol’s Edward Pan showed how the DS80000 performs an eye-diagram test for a pseudorandom binary sequence (PRBS), a key factor in physical-layer protocol compliance analysis for high-speed digital data transfers such as USB 2.0/3.0, MIPI D-PHY, 100/1000Base-T, and more. Built-in eye diagram templates facilitate analysis for these and other protocols.

The demo shows the use of sequence eye patterns to verify signal integrity. The oscilloscope performs jitter analysis such as time-interval error (TIE) trends and inspection of jitter magnitude.

Through use of fast Fourier transforms, that jitter magnitude can be converted into the frequency domain to see how jitter varies with frequency in a histogram display. Signal integrity can be further analyzed using the scope’s jitter decomposition functionality to separate deterministic and random jitter.

Other key features of the DS80000 include up to 4 Gpoints of memory depth per channel, enabling long-duration waveform acquisition and complex signal analysis. In addition, Rigol’s Smart Probe 2.0 intelligent probe system features a new 3.5-mm interface that’s compatible with both next-generation and legacy active differential and passive probes by means of adapters. Users gain simplified probe switching across different test scenarios.

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About the Author

David Maliniak | Executive Editor, Microwaves & RF

I am Executive Editor of Microwaves & RF, an all-digital publication that broadly covers all aspects of wireless communications. More particularly, we're keeping a close eye on technologies in the consumer-oriented 5G, 6G, IoT, M2M, and V2X markets, in which much of the wireless market's growth will occur in this decade and beyond. I work with a great team of editors to provide engineers, developers, and technical managers with interesting and useful articles and videos on a regular basis. Check out our free newsletters to see the latest content.

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About me:

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy, leaving to rejoin the EOEM B2B publishing world in January 2020. David earned a B.A. in journalism at New York University.