ARFTG Plans 67th Measurement Conference

May 30, 2006

San Francisco is host to the 67th Automatic RF Techniques Group (ARFTG) Microwave Measurement Conference held in conjunction with the 2006 International Microwave Show (IMS 2006). The ARFTG meeting provides an excellent locale for learning about new techniques in high-frequency measurements and for comparing notes with colleagues devoted to accuracy in microwave measurements. The 67th Microwave Measurement Conference, with a theme of "Design and Measurements of High Power Devices and Systems," will be held on June 16th in the Renaissance Parc 55 Hotel, San Francisco, CA. For more information about the conference or ARFTG, visit the group's site at www.arftg.org.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.