ARMMS Tackles Testing Through 110 GHz

May 30, 2006

The most recent ARMMS RF and Microwave Society measurement conference was held this past April 24th and 25th ath Milton Hill House, Steventon near Oxford, UK The measurement group includes some of the UK's leading test specialists and metrology experts. For example, Jimmy Yip of the National Physics Laboratory (NPL) addressed precision measurements from 75 to 110 GHz. Ben Allan of Oxford University reported on the current state of ultrawideband (UWB) technology and the methods available for testing UWB components. And Eric Wheatley of NERA offered the secrets of manufacturing waveguide filters through 50 GHz with no tuning. These papers and other presentations made at the ARMMS conference are available on the group's site at www.armms.org.

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.