Keithley Offers Course On Remote Testing

Aug. 25, 2006

Keithley Instruments is offering a two-day course on September 14 and 15, 2006 in Cleveland, OH on the use of National Instruments' LabVIEW software for remote control of multiple-vendor test instruments, "Optimizing Remote Control of Instruments in a LabVIEW(R) Environment." Attendees will learn how to assemble and configure instruments from a variety of vendors into an efficient test setup and control all of them from a single software interface. The course, which is not intended for production testing, consists predominantly of practical exercises in a lab setting, plus short lectures on a variety of related topics. For a direct link to the training course, go to:

http://www.keithley.com/events/training/trainingschedule

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.