J microTechnology Launches Lab Probe Station

March 1, 2007

J microTechnology has developed a compact Laboratory Microprobe Station, the model LMS-2709(S) with high-performance DC and RF probing capabilities for a fraction of the cost of many commercial systems. Ideal for educational environments or prototyping, the standard vacuum chuck on the probe station accommodates semiconductor and thin- and thick-film substrates as large as 2 inches by 2 inches. The precision X-Y-X probe translation manipulators align DC and/or RF probes to better than 0.0003 inches (0.01 mm) accuracy and repeatability. A nickel-plated steel platen on the probe station allows placement of as many as seven magnetic mount positioners to manipulate either standard needle or optional coaxial or triaxial probe tips. The probe station sells for less than $9,000 for single units, with special prices for universities buying multiple units. For more information, visit the J microTechnology web site at: http://www.jmicrotechnology.com

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.