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Vector Network Analyzers Range to 67 GHz in Bandwidth

April 8, 2021

With bandwidths of 50 and 67 GHz, the ZNA series of vector analyzers delivers optimal performance in applications including defense and aerospace.

David Maliniak

Related To: Microwaves & RF

Rohde & Schwarz has augmented its ZNA lineup of vector network analyzers with new models with bandwidths of 50 and 67 GHz, which brings high RF performance, an innovative hardware concept, and touch operation to new application areas. Signal integrity measurements as well as A&D and 5G component and module characterization are main applications for the new analyzer models.

The R&S ZNA features excellent RF performance, including wide dynamic range and extremely low trace noise, and comes with a user-friendly, purely touch-based GUI. Its hardware platform offers up to four internal, phase-coherent sources plus a fifth source that can be used as a second internal local oscillator or as an additional source for measurements on mixers. In combination with up to eight truly parallel measurement receivers, the R&S ZNA hardware architecture is ideal for demanding measurements on components and modules.

The R&S ZNA benefits engineers working on tasks such as high-end research and development. The new 50-GHz and 67-GHz R&S ZNA models offer opportunities for the aerospace and defense industry by enabling characterization of radar and transmitter/receiver modules as well as performing antenna measurements and supporting satellite applications such as downconverter characterization. They also offer versatile capabilities for both pulse generation and measurement, including a wide range of trigger functions. Since the analyzer’s original introduction, updates have added new features such as direct source monitor access, which enables accurate measurements even on high-gain devices such as satellite downconverters.

High-end R&D signal integrity measurements on differential lines of up to 67 GHz, and when combined with Rohde & Schwarz mmWave converters even beyond, are a strength of the new R&S ZNA models. In combination with integrated de-embedding solutions (ISD, SFD, DELTA-L and EZD), the R&S ZNA provides characterization of PCB conductor structures for high-speed signal transmission. The effects of fixtures, lead- ins and lead-outs are removed from the measurement results.

Covering the 5G frequency bands and, in combination with Rohde & Schwarz mmWave converters, the 6G frequency bands, the R&S ZNA is a future-proof solution for research on active and passive components such as LNAs, filters, antennas, and mixers. Over-the-air tests with Rohde & Schwarz OTA test solutions benefit from the analyzer’s excellent dynamic range. The R&S ZCxxx mmWave converters extend the frequencies into the terahertz range and provide high dynamic range and output power for on-wafer device characterization and antenna measurements on 6G components and modules.

About the Author

David Maliniak | Executive Editor, Microwaves & RF

I am Executive Editor of Microwaves & RF, an all-digital publication that broadly covers all aspects of wireless communications. More particularly, we're keeping a close eye on technologies in the consumer-oriented 5G, 6G, IoT, M2M, and V2X markets, in which much of the wireless market's growth will occur in this decade and beyond. I work with a great team of editors to provide engineers, developers, and technical managers with interesting and useful articles and videos on a regular basis. Check out our free newsletters to see the latest content.

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About me:

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy, leaving to rejoin the EOEM B2B publishing world in January 2020. David earned a B.A. in journalism at New York University.