Metrology System Studies MCMs

Dec. 20, 2013

A metrology system mechanically characterizes the tolerances and dimensions of multilayer PCBs.

The ContourSP large-panel metrology system developed by Bruker Corp. provides a large boost in evaluating multichip modules (MCMs) and other 3D printed-circuit-board (PCB) structures. Ideal for checking substrates with high-density interconnects (HDIs), these metrology systems can be used to measure each layer of a multiple-panel PCB panel during manufacturing, to contribute to increased yield and lower manufacturing costs. In an era of increasingly smaller PCB linewidths and tighter tolerances, the metrology systems are helping to dramatically improve productivity.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.