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Directional Detectors Reach 30 GHz

Jan. 10, 2013
Directional detectors simplify power monitoring in various systems through 30 GHz.
Surface-mount directional detectors from M/A-COM Technology Solutions, Inc. (M/A-COM Tech) include models suitable for power-monitoring applications through 30 GHz in commercial radios and military radar systems. Based on GaAs process technology and supplied in miniature, surface-mount 1.5 x 1.2 mm lead-free plastic packages, the directional detectors can be mounted with standard pick-and-place automated assembly equipment. Requiring less than
0.5-mA bias current, the detector line includes models MACP-010561, MACP-010562, and MACP-010563. Model MACP-010561 exhibits 0.25-dB insertion loss from 2 to 6 GHz with 16-dB directivity, 23-dB input return loss, and 24-dB output return loss. It operates with 100-mV DC offset and 0.3-V bias voltages. Model MACP-010562 operates from 6 to 18 GHz with 0.30-dB insertion loss and 19-dB directivity. It achieves 18-dB input return loss and 20-dB output return loss with100-mV DC offset and 0.3-V bias voltages. Model MACP-010563 is designed for use from 10 to 30 GHz, and provides 0.50-dB insertion loss and 16-dB directivity. It boasts16-dB input return loss and 17.5-dB output return loss, with 100-mV DC offset and 0.3-V bias voltages.

M/A-COM Technology Solutions, Inc., 100 Chelmsford St., Lowell, MA 01851; (978) 656-2500,

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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