Agilent Technologies And Delft University of Technology Research Large-Signal, Sub-mm-Wave Characterization
Sept. 23, 2008
Agilent Technologies announced it will collaborate with the Delft University of Technology in the Netherlands to research large-signal and sub-mm-wave characterization techniques. The research school of the Delft Institute for Microsystems and ...
Agilent Technologies announced it will collaborate with the Delft University of Technology in the Netherlands to research large-signal and sub-mm-wave characterization techniques. The research school of the Delft Institute for Microsystems and Nanoelectronics (DIMES) and Agilent share a common view on application-driven RF characterization tools. They use Agilent's software tools and instrumentation extensively in education and research programs.
With this new collaboration, enabled by the emerging SmartMix/MEMPHIS project, there has been a tremendous acceleration in research activities and capabilities at DIMES. This is evidenced by the creation of two complementary characterization facilities: the RF and the sub-mm-wave DIMES characterization laboratories. These new facilities will enable DIMES to continue developing technological advancement of devices, components, and circuits into the sub-mm-wave frequency range.
The Large-Signal and Sub-mm-Wave Characterization Techniques seminar agenda and registration information can be found at www.agilent.com/find/DIMES.
