• Anritsu
    6849ab0a2d0a331b9f5045f4 Pr2025shocklinesimultaneoussweep

    VNAs Sweep Four 1-Port Simultaneous Measurements

    June 11, 2025
    New VNA capabilities open up myriad applications in multi-band antenna test, phased-array validation, sub-6-GHz/mmWave 5G evaluations, and more.
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    Browse our complete IMS 2025 coverage.

    In Booth #2143 at IMS 2025, Anritsu will demonstrate a new simultaneous-sweep capability for its ShockLine MS46131A vector network analyzer (VNA), touted as the world’s first 1-port VNA supporting frequencies up to 43.5 GHz.

    Users can now perform simultaneous 1-port S-parameter measurements across up to four MS46131A units. Each unit can be independently configured with custom test settings—such as start and stop frequencies, IF bandwidth, and number of points—while all units perform sweeps in parallel. The result is significantly reduced test time and enhanced flexibility for a wide range of measurement scenarios.

    The simultaneous-sweep feature allows for coordinated sweep triggering through an external signal, synchronizing the start of sweeps across multiple VNAs. Suited for multi-band, multi-configuration test environments, it enables synchronized multi-band antenna characterization and parallel-path performance evaluation. Remote operation is supported via SCPI commands over uniquely assigned TCP port numbers for each of the MS46131A VNAs, leading to full automation and seamless integration into distributed test systems.

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    This new functionality is particularly suited for applications such as:

    • Multi-band antenna testing for LTE and Wi-Fi 7 (which operates up to 7 GHz)
    • Sub-6-GHz and mmWave 5G evaluations (including FR2, ranging from 24.25 to 52.6 GHz, and FR3, from 7.125 to 24.25 GHz)
    • Phased-array validation, where simultaneous measurements across multiple elements improve both speed and design insight
    • Remote or distributed test setups, including use in anechoic chambers

    A centralized PC interface manages all connected instruments, streamlining both test setup and data handling.

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    About the Author

    David Maliniak | Executive Editor, Microwaves & RF

    I am Executive Editor of Microwaves & RF, an all-digital publication that broadly covers all aspects of wireless communications. More particularly, we're keeping a close eye on technologies in the consumer-oriented 5G, 6G, IoT, M2M, and V2X markets, in which much of the wireless market's growth will occur in this decade and beyond. I work with a great team of editors to provide engineers, developers, and technical managers with interesting and useful articles and videos on a regular basis. Check out our free newsletters to see the latest content.

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