The Model 7340 phase noise tester and signal source analyzer measures carriers from 1 MHz to 40 GHz at offsets from 0.01 Hz to 100 MHz. Two-channel cross-correlation with internal references pushes measurement sensitivity toward -190 dBc/Hz. With options, one compact instrument also covers residual, pulsed and AM noise, transient analysis, time-stability analysis and VCO characterization using built-in low-noise supplies. Engineers use it for oscillator design, high-speed production testing and aerospace and defense source evaluation.