Webinar Evaluates The Cost Of Testing

Feb. 14, 2011
The price is right (free) for an online webinar being offered by market research leader Frost & Sullivan on how to lower the cost of testing. Led by Mariano Kimbara, Research Analyst for Frost & Sullivan's Measurement & Instrumentation group, and ...

The price is right (free) for an online webinar being offered by market research leader Frost & Sullivan on how to lower the cost of testing. Led by Mariano Kimbara, Research Analyst for Frost & Sullivan's Measurement & Instrumentation group, and featuring guest speaker Bill Lycette, Manager of Corporate Quality for Agilent Technologies, it is scheduled for Tuesday February 22, 2011 at 1 PM Eastern Standard Time (EST).

The webinar explains how to calculate the total cost of ownership on test equipment such as signal generators, spectrum analyzers, oscilloscopes, and power meters, and how to reduce the long-term costs of owning and using these instruments. "The cost of test for general purpose test equipment is not just about the initial capital price," Kimbara explains. "Calibration, maintenance, personnel required to support the test systems, etc., are all aspects that need to be taken into consideration when making a purchase decision."

"The costs to own and operate test & measurement equipment over its useful life can easily exceed the purchase price of the equipment," Lycette adds. "Identifying and understanding critical ownership factors through total cost of ownership modeling is an important step towards improving the bottom line of the enterprise."

Again, registration is free. For more information, click here.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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