Agilent Demos LTE Mobile Device Tester

Feb. 19, 2009
Visitors to the Mobile World Congress in Barcelona this past week were treated to a demonstration of Long Term Evolution (LTE) mobile device measurements performed by the one-box E6620 wireless communications test set from Agilent Technologies. The ...

Visitors to the Mobile World Congress in Barcelona this past week were treated to a demonstration of Long Term Evolution (LTE) mobile device measurements performed by the one-box E6620 wireless communications test set from Agilent Technologies. The demonstration included LTE transmit power measurements, error vector magnitude (EVM) measurements, and downlink transmit diversity measurements.

According to Niels Fach, Vice President and General Manager of Agilent's Mobile Broadband Division, "The E6620 wireless communications test set platform is the cornerstone of Agilent's product portfolio for testing LTE mobile devices across the entire R&D lifecycle. Partnering with Anite, we have already developed several first-to-market LTE test products to ensure the success of LTE deployment to meet aggressive time-to-market goals. Providing UE RF measurements to further meet the needs for LTE device design empowers our customers to stay at the forefront of this fast-evolving technology." The Agilent E6620 platform is designed to host a comprehensive set of LTE mobile development and test solutions spanning the entire R&D lifecycle, from early development through conformance and acceptance test.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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