Test System Checks 8 x 8 MIMO Performance

Aug. 21, 2008
Keithley Instruments has introduced the industry's first measurement-grade 8 x 8 multiple-input, multiple-output (MIMO) test system to support developers of next-generation wireless MIMO devices. The test system allows, for example, evolution of antennas ...
Keithley Instruments has introduced the industry's first measurement-grade 8 x 8 multiple-input, multiple-output (MIMO) test system to support developers of next-generation wireless MIMO devices. The test system allows, for example, evolution of antennas for adaptive beamforming applications, and can test a wide range of channel configurations for as many as eight synchronized radios or radio channels at one time. It provides the performance needed for multichannel MIMO testing, including full phase and amplitude control of RF carriers with better than 1 ns synchronization among signals. The 8 x 8 MIMO test system also boasts less than 1 ns peak-to-peak signal sampler jitter and less than 1 deg. of peak-to-peak RF carrier phase jitter. The test system is based on the company's model 2820 RF vector signal analyzer (VSAs) (with frequency range of 0.4 to 6.0 GHz) and the model 2920 vector signal generator (with frequency range of 10 MHz to 6 GHz). For more information on the 8 x 8 MIMO test system, visit the Keithley web site.
About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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