Test Set Checks Phase Noise

June 4, 2009
The all-digital model 5125A test set from Symmetricom is designed to measure the phase noise and Allan variance of high-frequency sources from 1 to 400 MHz. It can measure close-in phase noise to -145 dBc/Hz at an offset frequency of 1 Hz from a 10-MHz ...

The all-digital model 5125A test set from Symmetricom is designed to measure the phase noise and Allan variance of high-frequency sources from 1 to 400 MHz. It can measure close-in phase noise to -145 dBc/Hz at an offset frequency of 1 Hz from a 10-MHz carrier and -130 dBc/z offset 1 Hz from a 100-MHz carrier. According to Dr. Samuel Stein, the Chief Technologist at Symmetricom, "The 5125A eliminates the need for tedious multi-step configuration and calibration routines through the use of the direct sampling technique developed by Symmetricom for lower frequency oscillators. By extending the technology of earlier generation test sets, we were able to obtain excellent performance from the 5125A throughout a much broader frequency range." The single-box solution incorporates the firm's patented phase-measurement algorithm for fast but accurate measurements at the click of a button. The analyzer can make accurate phase-noise measurements as close as 0.0001 Hz from the carrier.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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