Jitter Test Instrument Offers Crest Factor Above 18 dB

Aug. 14, 2007
As serial buses advance through faster edges and narrower unit intervals, more pressure is being placed on the design, compliance testing, and debug processes. The J7000 Jitter Test System promises to alter serial signal streams by injecting ...

As serial buses advance through faster edges and narrower unit intervals, more pressure is being placed on the design, compliance testing, and debug processes. The J7000 Jitter Test System promises to alter serial signal streams by injecting Gaussian noise in a way that reflects real-world signal behavior. To evaluate the performance of components and systems, the J7000 is capable of adding precise amounts of white noise to the signal stream. This process allows the measurement of signal-to-noise ratio (SNR), carrier-to-noise ratio (CNR), and bit-error rate (BER). J7000 systems boast a crest factor of greater than 18 dB, which ensures the optimal distribution of random events to evaluate low BER. The series provides a frequency-dependent output power, which ranges from –131 dBm/–66 dBm to –3 dBm. It also provides an ultra-low-distortion signal path. The systems are available in frequency bands ranging from 1 MHz up to 5 GHz.

NoiseCom, Wireless Telecom Group, Inc., 25 Eastmans Rd., Parsippany, NJ 07054; (973) 386-9696, FAX: (973) 386-9191, Internet: www.noisecom.com

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About the Author

Nancy Friedrich | Editor-in-Chief

Nancy Friedrich began her career in technical publishing in 1998. After a stint with sister publication Electronic Design as Chief Copy Editor, Nancy worked as Managing Editor of Embedded Systems Development. She then became a Technology Editor at Wireless Systems Design, an offshoot of Microwaves & RF. Nancy has called the microwave space “home” since 2005.

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