83rd ARFTG Conference Takes A Measure of Testing

83rd ARFTG Conference Takes A Measure of Testing

As the 2014 IMS Exhibition winds down for another year, the IEEE event continues to provide educational value in the form of the 83rd Automatic RF Techniques Group (ARFTG) Conference, scheduled for June 6 in the Tampa Marriot Waterside Hotel & Marina. Especially for anyone who uses a microwave vector network analyzer (VNA), this is time well spent, with individual presentations on using VNAs and other instruments for nonlinear RF/microwave measurements, for performing calibrations, for performing measurements on metamaterials and waveguide devices, and for making noise measurements on different active and passive components. The ARFTG Conference has traditionally been an informative and informal way to interact with other RF/microwave measurement professionals, and meet with managers from some of the leading company sponsors of this event, including Agilent Technologies, Anritsu, Maury Microwave, Mini-Circuits, and National Instruments.

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