Monitors Continuously Check for RF Leaks in Sensitive Environments

Simple-to-use RadGreen RadSys RF Monitors provide continuous monitoring of EM radiation for selected frequency bands from 100 MHz to 40 GHz.
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Sept. 2, 2026
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Continuous RF/microwave monitoring can guard against unwanted electromagnetic (EM) leaks in a system. The RadGreen RadSys RF Monitors (see image above), now available from distributor Saelig Co. Inc., can monitor a surrounding environment; for example, for internet security or military security in sensitive operating settings.

Indoor and outdoor versions of the RF monitors operate over various frequency bands from 0.1 to 40.0 GHz as standalone units or in remotely controlled networks, without need of operators, maintenance, or calibration.

RadGreen's RadSys RF Monitors are well-suited for detecting defective products in RF/microwave production lines and for finding faults in electronic equipment during electromagnetic-interference (EMI) and electromagnetic-compatibility (EMC) testing.

The simple-to-install monitors provide immediate alerts of RF/microwave leaks within preset limits. They can be combined with EMI shielding products from Saelig to solve RF leakage problems, avoid production delays, and prevent hazardous environments for employees working with RF/microwave products.

Learn more about EMI/RFI mitigation

EMI/RFI shields and filters are both effective in controlling electromagnetic-based interference, although they work in different ways.
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About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.