Free Handbook Guides Semiconductor Testing

Feb. 14, 2007

Keithley Instruments has just published a free handbook for semiconductor parametric testing, "Parallel Test Technology: The New Paradigm for Parametric Testing." The 60-page handbook provides an overview of the emerging test technique known as parallel parametric testing, an approach for wafer-level parametric testing employing concurrent execution of multiple tests on multiple scribe line structures to maximum test throughput. A copy of the free handbook is available at the link: http://ggcomm.com/Keithley/PPTHandbook.html

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.