Keithley Teams With Mesatronic Group

Nov. 9, 2006

Keithley Instruments has partnered with the French Mesatronic Group to develop probe cards for semiconductor parametric testing at RF and for low-current DC applications. The new probe cards will work with Keithley parametric testers for simultaneous on-wafer RF and low-level DC testing on any combination of probe pins. The new probe card design will allow higher test throughput since both RF and DC tests can be made with a single wafer insertion. A key to the new probe card is a spatial transformer that interfaces the probe card with a flexible membrane circuit structure in the center of the wafer prober where the probe contact needles are attached. For more on Keithley, visit their web site at http://www.keithley.com/
For more on Mesastronic, go to
http://www.mesatronic.com/

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.