Wireless Communication Anritsu 621358098 5e38818862de3

WLAN Tester Enhanced with IEEE 802.11ax Support

Feb. 3, 2020
By adding support for IEEE 802.11ax, Anritsu’s MT8862A WLAN tester covers the waterfront in terms of data rates across all major WLAN standards.

By adding an IEEE 802.11ax option to its MT8862A WLAN tester, Anritsu Company now offers a tester that can evaluate signal quality at all data rates for every major WLAN standard. Thus, with one instrument, engineers are able to test the RF transmit and receive (TRx) characteristics of WLAN products across the entire range of IEEE802.11a/b/g/n/ac/ax (2.4- and 5-GHz bands).

With the option installed, the MT8862A efficiently evaluates the RF performance of IEEE 802.11ax-equipped devices. Measurements can be made in Direct Mode for quick evaluation or in Network Mode to test devices in near-real-world conditions. Because the signal quality of WLAN has different characteristics for each data rate, signal evaluation at each rate is critical. The MT8862A is touted as the only instrument that’s controllable at all data rates of leading WLAN standards, including 11ax Single User data rates utilizing orthogonal frequency-division multiplexing (OFDM) transmission technology.

Anritsu added 11ax support in the MT8862A to meet the growing demand for testing of the new standard. IEEE 802.11ax is now finding its way into mobile devices and PCs; it’s expected to become the primary technology in most WLAN equipment in a few years.

The Wireless Connectivity Test Set MT8862A supports the IEEE 802.11a/b/g/n/ac/ax standards. With its built-in Network and Direct test modes, the MT8862A can perform diverse measurements on WLAN products, including RF TRx characteristics such as Tx power, modulation accuracy, and Rx sensitivity.

In Network Mode, the MT8862A can evaluate WLAN products using a wireless connection. As a result, difficult procedures required by Direct Mode, such as product disassembly and control-line connections, are avoided. Benefits include simplified measurements and more repeatable test results.

Easily integrated with a PC, the MT8862A’s measurement screens are displayed by accessing the PC controller web browser, eliminating the need to configure a measurement environment by installing application software and drivers. In addition, remote operation is supported if the MT8862A and PC controller are connected on the same network segment.

Anritsu, https://www.anritsu.com/test-measurement/products/mt8862a

About the Author

David Maliniak | Executive Editor, Microwaves & RF

I am Executive Editor of Microwaves & RF, an all-digital publication that broadly covers all aspects of wireless communications. More particularly, we're keeping a close eye on technologies in the consumer-oriented 5G, 6G, IoT, M2M, and V2X markets, in which much of the wireless market's growth will occur in this decade and beyond. I work with a great team of editors to provide engineers, developers, and technical managers with interesting and useful articles and videos on a regular basis. Check out our free newsletters to see the latest content.

You can send press releases for new products for possible coverage on the website. I am also interested in receiving contributed articles for publishing on our website. Use our contributor's packet, in which you'll find an article template and lots more useful information on how to properly prepare content for us, and send to me along with a signed release form. 

About me:

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy, leaving to rejoin the EOEM B2B publishing world in January 2020. David earned a B.A. in journalism at New York University.

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