Rohde & Schwarz
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Phase-Noise Analyzer Now Measures to 56 GHz from External Local Oscillators

July 31, 2025
Rohde & Schwarz’s FSWP phase-noise analyzer and VCO tester now supports external LO inputs for absolute or residual phase-noise measurements up to 56 GHz.

Rohde & Schwarz recently announced upgrades to its FSWP phase-noise analyzer and VCO tester that extend the instrument’s range to 56 GHz (and to 325 GHz with external mixers). The highly sensitive instrument is equipped with extremely low-noise internal sources and cross-correlation of sources.

In a recent live demonstration (see the video), Rohde’s Darren Tipton, Director of Product Management for Signal and Spectrum Analyzers, explained that the FSWP is now capable of making residual or additive phase-noise measurements directly in the box at up to 54 GHz—even on pulsed signals.

In the demo, the FSWP makes measurements from an amplifier using its external local-oscillator (LO) inputs. The measurements reveal that the amplifiers ring at 47 GHz. Another new feature in the FSWP is a noise-figure marker.

Given that wideband phase noise of a device is very closely correlated to the device’s noise figure, the FSWP now enables users to perform active noise-figure measurements on devices with varying drive levels. It provides an alternative to Y-factor measurements or using a network analyzer for noise-figure results.

About the Author

David Maliniak | Executive Editor, Microwaves & RF

I am Executive Editor of Microwaves & RF, an all-digital publication that broadly covers all aspects of wireless communications. More particularly, we're keeping a close eye on technologies in the consumer-oriented 5G, 6G, IoT, M2M, and V2X markets, in which much of the wireless market's growth will occur in this decade and beyond. I work with a great team of editors to provide engineers, developers, and technical managers with interesting and useful articles and videos on a regular basis. Check out our free newsletters to see the latest content.

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In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy, leaving to rejoin the EOEM B2B publishing world in January 2020. David earned a B.A. in journalism at New York University.

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