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June 8, 2007

June 8, 2007
MWRF Update Microwaves & RF UPDATE | June 8, 2007 Jack Browne, Technical Director Free Application Note Describes How to Minimize System Uncertainty Using Agilent L ...

MWRF Update

Microwaves & RF UPDATE | June 8, 2007

Jack Browne, Technical Director

Free Application Note Describes How to Minimize System Uncertainty Using Agilent L Series Switches

Reduce measurement uncertainty with Agilent's economically priced L Series switches. With 0.03 dB insertion loss repeatability guaranteed for 2 million switching cycles (and typically 5 million switching cycles) and unmatched isolation, the L Series of high-performance microwave switches provide the performance you need from DC to 26.5 GHz.

Click here to learn more and to download a free copy of the application note.



Hawaii Or Bust!
By Jack Browne, MWRF Technical Director

For those attending the 2007 MTT-S International Microwave Show at the Hawaii Convention Center in Honolulu, HI, there were few surprises. As usual, the technical program, which continues through Friday of this week with the semi-annual Automatic RF Techniques Group (ARFTG) meeting, was strong and well balanced with topics ranging from device and component design to computer-aided-engineering (CAE) software and test and measurement techniques. In spite of the lure of nearby beaches, the technical sessions were well attended, and conference visitors were given their money's worth in terms of qualify and quantity of the technical sessions.

A random sampling of exhibitors would not register the same level of satisfaction. Traffic to the exhibition floor was sporadic, and booth location played a major role in the quality and quantity of the visitors to each booth. For more exhibitors, it was either feast or famine, with even some of the major booths failing to draw the booth traffic of recent MTT-S shows.

Ironically, those questions about why Mini-Circuits didn't come to the MTT-S this year as an exhibitor stopped after the first day of the show. Instead, the questions were turned to statements regarding the vision and brilliance of one Harvey Kaylie of Mini-Circuits in choosing to pass on this year's MTT-S.

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Freescale Launches 1-kW Device at MTT-S

Freescale Semiconductor took the wraps off the world's highest-power LDMOS transistor at this week's MTT-S in Honolulu. The company's model MRF6VP11KH delivers 1 kW pulsed output power at 130 MHz. Designed for use from 10 to 150 MHz in magnetic resonance imaging (MRI) systems and plasma generators, the transistor features 65-percent drain efficiency and more than 27 dB gain. The 50-V device offers relatively high terminal impedances for ease of matching. It is supplied in a RoHS-compliant, air-cavity package with excellent thermal qualities.

Freescale Semiconductor

Agilent Showcases Test Solutions at MTT-S

The MXA signal analyzer was among the latest test and measurement solutions on display at this week's MTT-S from Agilent Technologies. The Agilent N9020A MXA signal analyzer features a new Instrument Security option for secure measurement environments, a new phase-noise measurement application, MATLAB drivers, time gating, and an enhanced measurement application for IEEE 802.16e orthogonal frequency-division-multiple-access (OFDMA) mobile WiMAX measurement applications. The companion Agilent MXG signal generator was also on display at the company's large display stand, along with the economy Agilent N9310A and N9320A RF benchtop signal generators. The Agilent N9340A handheld instrument at 100 kHz to 3 GHz is an ideal solution for installation and maintenance customers in a variety of industries, including wireless service providers, aerospace/defense, spectrum management authorities, television, and broadcasting.

Agilent Technologies

More News

Times Microwave Improves MIL-C-38999 Contacts
Modules Simplify RFID Integration
Picosecond Pulse Labs Shows Phase-Matched Balun
Toshiba Touts X-Band GaN HEMT at MTT-S

For The Best In Test and Components

Visit Microwaves & RF's RF Test Blog to learn about the latest developments in RF and microwave test equipment and measurement techniques. The blog highlights hot new products, white papers, and application notes. And while you're there, take a look at the RF Components Blog, sponsored by M/A-COM for the latest component news, at


Happenings - Conferences

WCA 2007 (Wireless Communications Association International)
June 12-15, 2007
Omni Shoreham Hotel
Washington, DC

Logic NVM 2007 - Inside Tomorrow's Consumer Electronics
June 14, 2007
Hyatt Regency Santa Clara
Santa Clara, CA

2008 IEEE Radio and Wireless Symposium (with WAMICON)
January 22-24, 2008
Orlando, FL

2008 IEEE International Solid-State Circuits Conference (ISSCC)
February 3-7, 2008
San Francisco Marriott Hotel
San Francisco, CA

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