CAE Software Improves Sensitivity Analysis

Oct. 8, 2009
Computer Simulation Technology (CST) has introduced an efficient algorithm in its CST MICROWAVE STUDIO (CST MWS) software that enables sensitivity analysis for several parameters in a single simulation run. CST MWS 2010 features a sensitivity analysis ...

Computer Simulation Technology (CST) has introduced an efficient algorithm in its CST MICROWAVE STUDIO (CST MWS) software that enables sensitivity analysis for several parameters in a single simulation run. CST MWS 2010 features a sensitivity analysis algorithm that is capable of evaluating the S-parameter dependencies on various model parameters after a single three-dimensional (3D) electromagnetic (EM) simulation run. This allows all further evaluations for different model parameter sets to be derived without restarting the full-wave simulation. According to Dr. Martin Timm, Director of Marketing at CST, "The sensitivity of a device's performance to small parameter variations is a key concern in many design processes. Traditional approaches require multiple 3D simulations to derive the various parameter dependencies. CST's new sensitivity analysis gives engineers a fast and efficient means of further minimizing design risk."

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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