Predicting the outcome of advanced processes, such as those for fabricating semiconductors or microelectromechanical-systems (MEMS) devices, can be extremely complex. The calculations are not made any easier as device features...
Register or sign in below to download the full article in .PDF format, including high resolution graphics and schematics when applicable.
Register to view the full article
Register to view the full article. By registering for Microwaves & RF now, you'll not only gain access to premium content, you'll also become part of an exclusive, robust global engineering community!
Participate in Expert and Reader driven Q&A's
Start your own conversation by commenting on any article or blog
Download high-quality content including the highly anticipated Salary & Career Report