Agilent Offers Test Solutions At 4G World

Sept. 9, 2009
Agilent Technologies announced it will show its comprehensive set of 4G test solutions for LTE, WiMAX, WLAN, HSPA, femtocell, and MIMO at 4G World this coming Sept. 16 and 17 (McCormick Place, Chicago, IL). The solutions encompass both hardware and ...
Agilent Technologies announced it will show its comprehensive set of 4G test solutions for LTE, WiMAX, WLAN, HSPA, femtocell, and MIMO at 4G World this coming Sept. 16 and 17 (McCormick Place, Chicago, IL). The solutions encompass both hardware and software and include signal generators, signal analyzers, and design simulation software aimed at research and development, design verification, manufacturing, protocol conformance and interoperability, and maintenance.

Hardware includes the PXB MIMO receiver tester, the Agilent 4- and 6-GHz FieldFox handheld RF analyzers, the Agilent E6651A mobile WiMAX test set, and the PNA-X nonlinear vector network analyzer (VNA), while software includes the company's well-known Advanced Design System (ADS) simulation software suite. According to Ron Nersesian, Senior Vice President and General Manager of Agilent's Electronic Measurement Group, "Our extensive lineup of leading-edge, performance-based systems demonstrates our continued commitment to the full spectrum required for 4G test solutions." At the event Agilent will make available for attendees its new 450-page book by 32 technical experts, "LTE and the Evolution to 4G Wireless Design and Measurement Challenges," a must-have reference for anyone involved in LTE.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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