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Agilent Offers Free EMI App Note

May 7, 2009

Agilent Technologies has created a new application note on making precompliance electromagnetic-interference (EMI) measurements using the firm's X-Series of signal analyzers. The application note addresses many of the challenges associated with making precompliance conducted and radiated emissions measurements for commercial and military standards on the Agilent X-Series signal analyzers.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.