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Special Report: Test's Evolution Mirrors the Wireless World

April 8, 2024
As wireless technologies evolve and proliferate, so must the test-and-measurement industry's offerings.

There's no stopping the ceaseless advances in wireless technologies, and we're all glad for it. We want our data, we want more of it faster, and we want it now. But unless test-and-measurement technologies and methodologies evolve to meet the challenges of mmWave, mMIMO, and more, we're all out of luck.

Fortunately, as usual, the brilliant minds in the test industry consistently manage to invent and re-invent their offerings to stay a step ahead of the equally brilliant minds of the wireless world.

We explored the challenges and opportunities for the future as part of Microwaves and RF's Test and Measurement Week in March. We’ve assembled all of the content from the event for you to peruse and download for future reference.

Download the eBook

Test & Measurement

Test's Evolution Mirrors the Wireless World (Download)

April 16, 2024
Members can download this free Microwaves & RF eBook that addresses test and measurement topics.

On-Demand Webinar

Webinars

Addressing Complex Functional Test Requirements Using Modular PXI-Based Testing Solutions

March 7, 2024
Automated solutions for system, subsystem, and PCB-level functional test verify the item tested is operating as expected, and is a critical step in ensuring quality of a product...

Insights from Industry Experts

Dreamstime_miklmakmagnitka_209615501
Test & Measurement

VNAs Must Keep Pace with Advanced Signal-Integrity Demands

March 4, 2024
A vector network analyzer needs the proper frequency coverage and dedicated SI measurement tools to achieve accurate and repeatable results for today’s high-speed designs.
Rohde & Schwarz
Test & Measurement

Optimizing RF Power Amplifiers for Wideband Comms Apps

March 5, 2024
Designing RF power amplifiers that exhibit linear behavior over a wide bandwidth and can support high-order modulation schemes becomes increasingly important as more complex, ...
NI
Test & Measurement

Customizing Tests for Today’s Electronically Scanned Arrays

March 7, 2024
The first scanned phased arrays used a single transmitter and receiver connected to all antenna elements through phase shifters. Currently, most use solid-state transmit/receive...
135607187 © Sarayut Thaneerat | Dreamstime.com
Test & Measurement

Emerging Cloud Tech Creates Certification and Verification Challenges

March 8, 2024
Where are we in the cloud today when it comes to testing and verifying application solutions and infrastructure?
Dreamstime_shmeljov_215290382
Test & Measurement

The Expanding Role of Test in Advanced Electronic Systems Development

March 6, 2024
The increasing levels of functionality, integration, and networking in today’s advanced electronic products brings increased attention and importance to the test & measurement...

Sponsored Recommendations

Ultra-Low Phase Noise MMIC Amplifier, 6 to 18 GHz

July 12, 2024
Mini-Circuits’ LVA-6183PN+ is a wideband, ultra-low phase noise MMIC amplifier perfect for use with low noise signal sources and in sensitive transceiver chains. This model operates...

Turnkey 1 kW Energy Source & HPA

July 12, 2024
Mini-Circuits’ RFS-2G42G51K0+ is a versatile, new generation amplifier with an integrated signal source, usable in a wide range of industrial, scientific, and medical applications...

SMT Passives to 250W

July 12, 2024
Mini-Circuits’ surface-mount stripline couplers and 90° hybrids cover an operational frequency range of DC to 14.5 GHz. Coupler models feature greater than 2 decades of bandwidth...

Transformers in High-Power SiC FET Applications

June 28, 2024
Discover SiC FETs and the Role of Transformers in High-Voltage Applications