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On-Wafer Measurements Reach As High As 220 GHz

May 23, 2016
Anritsu will be active at IMS Booth No. 949 showing many of its test instruments in operation. In-booth demonstrations will include high-power vector-network-analyzer measurements and millimeter-wave signal analysis.
(Image courtesy of Anritsu).

The annual International Microwave Symposium (IMS) offers an excellent opportunity to see high-frequency test equipment in action, and not just in the form of images on a company’s website. One of the leaders in RF/microwave signal generators and analyzers, Anritsu Co., will be active at IMS Booth No. 949 showing some of its many test instruments in operation. In-booth demonstrations will include high-power vector-network-analyzer (VNA) measurements and millimeter-wave signal analysis. For those interested in the coming of Fifth Generation (5G) wireless standards and the promise of increase millimeter-wave signal activity, Anritsu personnel will also demonstrate on-wafer device characterization across a mind-boggling total frequency range of 70 kHz to 220 GHz. In addition to various models of VectorStar microwave and millimeter-wave VNAs, the booth will feature a variety of vector signal generators and portable test tools ready to be put to the test. Don’t miss the chance to do some channel scanning with the easy-to-use line of Spectrum Master portable spectrum analyzers, including the 9-kHz-to-4-GHz model MS2712E, which is also capable of phase-noise measurements.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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