Test Instruments Set New Accuracy Levels

June 14, 2012
As in years past, the 2012 IMS exhibition provides an effective means of quickly assessing current industry test and measurement capabilities. One booth worth a visit is Agilent Technologies (No. 1015), with 25 different instrument and simulation ...

As in years past, the 2012 IMS exhibition provides an effective means of quickly assessing current industry test and measurement capabilities. One booth worth a visit is Agilent Technologies (No. 1015), with 25 different instrument and simulation software demonstrations. The firm traditionally uses the IMS exhibition as a launching pad for new products, and 2012 is no exception. Barry Alcorn, Americas Market Segment Manager in Agilent's Electronic Measurement Group, notes: "We are really excited about our new tools for circuit-level modeling through system verification for general RF/microwave, 4G communications, and aerospace/defense applications. Plus, we are pleased to present a range of premier solutions with our partners. You'll find these co-located on Agilent Avenue and around the IMS show floor."

An example is the model N5245A PNA-X microwave vector network analyzer, available for two- or four-port operation from 10 MHz to 50 GHz. It offers a 126-dB system dynamic range with the capability of producing +16 dBm test port power with low harmonics of -60 dBc. The test receiver has a noise floor of -111 dB, measured in a 10-Hz intermediate-frequency (IF) bandwidth. Another new product is the MXA X-Series signal analyzer, with versions available covering 10 Hz to 3.6 GHz, 8.4 GHz, 13.6 GHz, and 26.5 GHz. The analyzers provide resolution as fine as 1 Hz, with resolution bandwidths from 1 Hz to 8 MHz. For fans of software, the company will also have on hand the latest releases of its Advanced Design System (ADS), EMPro, GoldenGate, SystemVue, Genesys, and IC-CAP programs.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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