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    1. Technologies
    2. Test & Measurement

    ARMMS Announces Next Test Conference

    Sept. 20, 2006
    The ARMMS RF and Microwave Society will hold its next measurement conference on Monday and Tuesday, November 6-7, 2006, at Harben House, Tickford Street, Newport Pagnell, Buckinghamshire, England. The planned program includes papers such as "Large signal ...

    The ARMMS RF and Microwave Society will hold its next measurement conference on Monday and Tuesday, November 6-7, 2006, at Harben House, Tickford Street, Newport Pagnell, Buckinghamshire, England. The planned program includes papers such as "Large signal network analyzer measurments applied to behavioral model extraction" by presenters from Belgium, as well as "Noise in circuits for frequency conversion and geneation," by mixer guru Steve Maas of Applied Wave Research, and presentations on linear power amplifier measurements and millimeter-wave radiometry. For more information on ARMMS or the test conference, visit the group's web site at www.armms.org.

    About the Author

    Jack Browne | Technical Contributor

    Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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