Keithley Aims PXI Products At Hybrid Test

Nov. 16, 2006
Keithley Instruments has introduced a line of PXI instruments for hybrid measurement system applications. The company's new KPXI product line includes simultaneous data-acquisition boards, multifunction analog input/output (I/O) boards, high-speed analog ...

Keithley Instruments has introduced a line of PXI instruments for hybrid measurement system applications. The company's new KPXI product line includes simultaneous data-acquisition boards, multifunction analog input/output (I/O) boards, high-speed analog output boards, a 130-MSamples/s digitizer module, digital I/O modules, embedded PC controllers, MXI bridges, and a PXI chassis. The product line adheres to the PCI eXtensions for Instrumentation (PXI) standard, which is based on the PCI interface. They take advantage of the company's advanced measurement technologies, including its Test Script Processor (TSP) architecture which enables distributed programming and concurrent execution across multiple instruments and controllers. For more information on the KPXI hybrid test solutions, visit the company's website at http://www.keithley.com.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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