CD Helps Improve RF Measurements

May 31, 2007

A free CD-ROM from Keithley Instruments, "Making Quality RF Measurements That Save Time, Money, and Effort," is a useful resource for any engineer or technician involved with making RF device or component measurements. The CD contains a library of application notes, white papers, and even a link to an on-line seminar to help improve the quality of RF measurements. Copies of the disk are free, but require a log-in procedure. For more information, visit the Keithley website at: http://www.keithley.com/

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.