Agilent Unveils LTE Test Solution

Dec. 6, 2007

Agilent Technologies has announced a new modulation analysis option for its 89600 Series Vector Signal Analysis (VSA) software, aimed at evaluation of 3GPP Long Term Evolution (LTE) wireless systems and their components. Developed for testing and troubleshooting LTE transceivers and components, the option supports analog and digital physical layer (PHY) signal analysis with both uplink and downlink signals. The LTE option makes possible spectrum- analysis and error-vector-magnitude (EVM) measurements for a full frame, within a frame or subframe, and on synchronization and reference channels. It provides a test solution for transmitter measurements on both base stations and mobile stations. The software is designed for use with the firm's PSA Series spectrum analyzers and can achieve EVM performance of -50 dB for a 10-MHz LTE signal. The combination supports LTE bandwidths to 20 MHz with a type 1 FDD frame structure and a wide range of modulation formats, including BPSK, QPSK, 16QAM, and 64QAM.

Agilent Technologies (www.agilent.com)

About the Author

Jack Browne

Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.