Software Helps Solve Measurement Problems

Nov. 8, 2007
Making better measurements is usually a noble pursuit, especially for the types of microwave measurements that can require massive amounts of data, such as antenna evaluation and radar- cross-section (RCS) measurements. Antennas, for example, must be ...

Making better measurements is usually a noble pursuit, especially for the types of microwave measurements that can require massive amounts of data, such as antenna evaluation and radar- cross-section (RCS) measurements. Antennas, for example, must be analyzed across the expanse of their radiation patterns and often over a wide range of operating frequencies. For that reason, any tool that helps to simplify the measurement process is welcome. One of the latest additions to the test arsenal is the MI-3000 Arena data acquisition and analysis software package from MI Technologies (www.mi-technologies.com).

Admittedly not the first name that comes to mind when considering software for orchestrating automatic-test-equipment (ATE) operations and data analysis, the Suwanee, GA-based company has been involved for some time in the development of measurement solutions for application- sensitive requirements. The firm developed the new MI-3000 Arena software package to streamline the measurement processes for these difficult-to-test components, such as antennas or RCS targets. The software provides a choice of four different operating environments so that operators have a certain level of comfort when performing advanced measurement and analysis functions. In an area where measurements are never trivial, the addition of another useful tool is always welcome.

by Jack Browne, MWRF Technical Director

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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