Portable VNAs Tune To 20 GHz

Aug. 26, 2009
This pair of compact VNAs are light in weight, but pack a laboratory full of measurement capability thanks to an advanced three-receiver architecture, 12-term error correction, and flexible user interface.

Vector network analyzers (VNAs) usually occupy mul-tiple rack spaces in an equipment enclosure. But the two latest VNA Master VNAs from Anritsu Company, the MS2026B and the MS2028B, are portable, batterypowered versions of the microwave test instrument, weighing less than 10 lbs but bringing full two-port S-parameter measurement capability across frequency ranges of 5 kHz to 6 GHz and 5 kHz to 20 GHz, respectively. With fast tuning speed, high accuracy by virtue of 12-term error correction algorithms, and flexible display capabilities, these compact VNAs are ideal for troubleshooting and in-field use.

The MS2026B and MS2028B VNA Masters (see figure) are suited for in-field cable and antenna analysis. They sport a three-receiver (port 1, port 2, and reference receivers) configuration with two active test ports, allowing measurements of all four S-parameters with a single connection. The instruments can simultaneously collect data on S21 and S11 parameters in a single sweep, and then using the auto-reversing capability, can capture information on the S12 and S22 parameters during a single sweep.

Based on frequency-domain reflectometry (FDR), the MS2026B and MS2028B analyzers can be used to characterize the amplitude and phase of both passive components and cables, bringing the accuracy of much larger rack-mounted systems to in-field measurements. With an optional internal bias tee, they are well suited to active-device testing. They can also be equipped with optional time-domain capability for finding faults in cables by means of distance- to-fault (DTF) measurements.

Both VNA Masters offer intermediate- frequency (IF) measurement bandwidths of 10 Hz to 100 kHz, with frequency accuracy of 1.5 ppm and frequency resolution of 1 kHz. As much as +3 dBm test port power is available through 3 GHz and as much as -3 dBm test port power through 20 GHz. The transmission dynamic range is 80 dB through 3 GHz, 75 dB through 6 GHz, and 65 dB through 20 GHz. The typical sweep speed for an IF bandwidth of 100 kHz and 1001 data points is 525 microseconds/point to 6 GHz and 750 microsecond/point to 20 GHz in support of real-time, on-site tuning.

Results are shown on a full-color, 8.4-in. thin-film-transistor (TFT) display that can be user-formatted for single, dual, tri, or quad partitions, showing results for all four S-parameters simultaneously. The analyzers feature 1 GB of internal memory and can store more than 4000 traces and measurement setups. In addition, a Universal Serial Bus (USB) port allows data to be sent to an external computer for storage and/or analysis. The operator interface features soft keys, directional buttons, and a rotary knob.

The analyzers are available with a large number of options, including a vector voltmeter for cable phase matching, a power monitor option for measurements from 1 MHz to 20 GHz, a differential S-parameter measurement option, a power meter option for measurements from 50 MHz to 18 GHz, and a secure data software option. P&A: $19,950 and up; 6 to 8 wks. Anritsu Co., 490 Jarvis Drive, Morgan Hill, CA 95037-2809; (408) 778-2000, FAX: (408) 776-1744, Internet: www.us.anritsu.com.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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