Spectrum Analyzer Includes Phase Noise Tester

June 27, 2006
At the 2006 MTT-S in San Francisco (June 12-16), Rohde & Schwarz launched the FSUP, a spectrum analyzer with built-in phase-noise test set. Available in versions with top frequencies of 8 GHz, 26.5 GHz, or 50 GHz, the instrument measures phase noise by ...

At the 2006 MTT-S in San Francisco (June 12-16), Rohde & Schwarz launched the FSUP, a spectrum analyzer with built-in phase-noise test set. Available in versions with top frequencies of 8 GHz, 26.5 GHz, or 50 GHz, the instrument measures phase noise by comparing the performance of a device under test (DUT) to the phase noise of a reference signal source via an internal or external reference oscillator. At an input frequency of 640 MHz and frequency offset of 10 kHz, the phase noise of the FSUP is better than -135 dBc/Hz with an internal reference. At a 10-MHz offset from the same carrier frequency, the phase noise is a stunning -165 dBc/Hz. For more information on this powerful measurement tool, visit the Rohde & Schwarz website at www.rohde-schwarz.com
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About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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