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Portable Instruments Include Microwave VNAs

Sept. 20, 2016
A series of USB-compatible VNAs provide cost-effective S-parameter measurements through millimeter-wave frequencies.
For those needing microwave vector network analyzers (VNAs) in compact form factors, Copper Mountain Technologies will present a representative sampling of its highly accurate test instruments at EDI CON 2016, booth 715. The innovative test firm will showcase its one-port model R60 reflectometer, its two-port model S5065, and its CobaltFx frequency extenders with output signals to 110 GHz.

The USB-equipped model R60 single-port VNA makes reflection (S11) measurements from 1 MHz to 6 GHz and can be used with any PC with MS Windows operating system. The compact form factor allows the VNA to be directly connected to a device under test (DUT) to eliminate measurement errors associated with test cables.

The two-port model S5065 VNA also uses a USB connection to a PC to provide 138-dB dynamic range for S-parameter measurements from 20 kHz to 6.5 GHz. The pocket-sized VNA can capture as many as 200,001 measurement points per sweep with blazing 70-microsecond measurement speed. It delivers test port power from -50 to +5 dBm. In addition to the analyzers, the firm is also showing it CobaltFx frequency extenders, which models capable of cost-effectively generating millimeter-wave frequencies over waveguide bands of 50 to 75 GHz, 60 to 90 MHz, and 75 to 110 GHz.

In addition to the compact test instruments, the company’s engineering manager, Ben Maxson, is hosting a Wednesday workshop focused on examining the measurement needs of emerging Internet of Things (IoT) applications. The workshop, “Overcoming the Evolving Test and Measurement Requirements of IoT Devices,” is scheduled for Room 202, Sept. 21, from 1:50 to 2:30 p.m. 

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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