83rd ARFTG Conference Takes A Measure of Testing

June 5, 2014

The 83rd ARFTG Conference offers practical solutions for a wide range of RF/microwave measurements.

As the 2014 IMS Exhibition winds down for another year, the IEEE event continues to provide educational value in the form of the 83rd Automatic RF Techniques Group (ARFTG) Conference, scheduled for June 6 in the Tampa Marriot Waterside Hotel & Marina. Especially for anyone who uses a microwave vector network analyzer (VNA), this is time well spent, with individual presentations on using VNAs and other instruments for nonlinear RF/microwave measurements, for performing calibrations, for performing measurements on metamaterials and waveguide devices, and for making noise measurements on different active and passive components. The ARFTG Conference has traditionally been an informative and informal way to interact with other RF/microwave measurement professionals, and meet with managers from some of the leading company sponsors of this event, including Agilent Technologies, Anritsu, Maury Microwave, Mini-Circuits, and National Instruments.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.