Image

DSOs Capture Signals To 300 MHz

June 10, 2013
A line of low-cost oscilloscopes is ideal for maintenance applications through 300 MHz.

A line of digital storage oscilloscopes (DSOs) from B& K Precision was recently expanded with the addition of the 2550 series of two- and four-channel instruments. The oscilloscopes offer sampling rates to 2 GSamples/s and display bandwidths of 70 to 300 MHz, with 24 kpoints/channel capture memory. The oscilloscopes are ideal for repair, service, and maintenance applications. As an example of the new 2550 series DSOs, a four-channel, 300-MHz model shows results on a widescreen, 7-in. thin-film-transistor (TFT) display screen with excellent visibility even in daylight. The scopes—which have built-in waveform mathematics and Fast Fourier Transform (FFT) functions—include powerful debugging tools such as digital filtering with adjustable limits, waveform recorder mode, pass/fail testing, and advanced triggering capabilities. They bring 32 automatic measurements and feature adequate memory for recalling as many as 20 saved waveforms and 20 oscilloscope test setups. Each DSO is equipped with local-area-network (LAN) and Universal-Serial-Bus (USB) interface for control via a personal computer (PC); software is included with each instrument.

B & K Precision, 22820 Savi Ranch Pkwy., Yorba Linda, CA 92887-4610; (714) 921-9095, (800) 462-9832, FAX: (714) 921-6422.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Sponsored Recommendations

Phase Noise Fundamentals: What You Need to Know

Dec. 26, 2024
Gain a deeper understanding of phase noise and its impact on oscillators. This white paper offers a concise technical introduction to phase noise concepts, along with an overview...

Selecting Your Next Oscilloscope: Why Fast Update Rate Matters

Dec. 26, 2024
Selecting your next oscilloscope - A guide from Rohde & Schwarz

Webinar: Fundamentals of EMI Debugging & Precompliance

Dec. 26, 2024
In this webinar our expert will guide you through the fundamentals of EMI debugging & precompliance measurements.

Learn the Fundamentals of Test and Measurement

Dec. 26, 2024
Unlock your measurement potential with Testing Fundamentals from Rohde & Schwarz. Expert resources to help you master measurement basics. Explore now.