Portable Analyzer Grabs 9 kHz to 9 GHz

June 5, 2013
Anritsu has certified its model MS2720T portable spectrum analyzer for NRSE-qualified AM/FM broadcast measurements.  

Although a top supplier of benchtop RF/microwave test equipment, Anritsu Co. has made serious strides in recent years in the area of portable test equipment, and will have examples of its portable Spectrum Master™ handheld spectrum analyzers at the 2013 IMS, at booth No. 938. The firm recently announced that its model MS2720T Spectrum Master with option 709 has been self-certified by Anritsu to comply with the National Radio Systems Committee (NRSE) requirements for conducting amplitude modulation (AM) and frequency-modulation (FM) broadcast measurements. The analyzer, which covers 9 kHz to 9 GHz, provides field engineers and technicians with the confidence that their AM and FM broadcast measurements are in compliance with NRSE requirements. The portable analyzer, which incorporates advanced measurement software and an easy-to-use 8.4-in. touchscreen display, can make a wide range of automatic measurements, including noise sidebands, harmonics, and field strength. It provides a dynamic range of better than 106 dB with a 1-Hz resolution bandwidth (RBW) and displayed average noise level (DANL) of -163 dBm with a 1-Hz RBW. The phase noise is a low -112 dBc/Hz offset 10 kHz from a 1-GHz carrier.

Editor's Note: For more show coverage, be sure to visit Microwaves & RF's IMS 2013 page.

About the Author

Jack Browne | Technical Contributor

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

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